09:00 - Matthias Stecher | HPPI, Germany

Test methods to determine the ESD robustness of devices and circuits

ABSTRACT & BIO

 

10:00 - Coffee break
 

10:30 - Joost Willemen | Infineon, Germany 

Tutorial on off-chip ESD protection

ABSTRACT & BIO

 

11:30 - Harald Gossner | Intel, Germany

System Efficient ESD Design
ABSTRACT & BIO

12:30 - Lunch

14:00 - Alberto Tosi | Politecnico di Milano, Italy

Towards single-photon counting LIDAR for automotive applications

ABSTRACT & BIO

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15:00 - Werner Ritter | Daimler AG, Germany

What happens to self-driving cars if the weather turns bad? New Sensor Suite for driver assistance and automated driving working 24/7 – in all weather

ABSTRACT & BIO

16:00 - Coffee break 

16:30 - Eric Bury | imec, Belgium

Reliability challenges in upcoming VLSI technologies

ABSTRACT & BIO

17:30 - Gerhard Weindl | BMW Group, Germany

Aspects of Semiconductor Quality from the OEM Perspective - A Tutorial on Automotive Semiconductor Quality Paradigms

ABSTRACT & BIO